Ripple Current: An Increasingly Relevant Test to Complement Design Considerations
Written By: Vincent Mao, Joe Hock, Caleb Winfrey

Abstract:
The world is shifting towards electrification with electric vehicles (EVs), renewable energy, and smaller, more powerful, but efficient, system-on-chips (SOCs) as both signal and power integrity across different environments become a concern. The ripple current test is usually required to assess device performance up to 20°C above room temperature. This overview focuses on the test setups used to cover three ESR tiers (low, medium, high, respectively) for applications from signal integrity to microwave/RF. We present initial results and procedures to collect and analyze data as well as considerations for performance impacts with mounted parts. Ongoing challenges are also discussed.

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